Abstract
The embedded modulated scatterer technique has been investigated in the past as a means of determining the dielectric properties of a material of interest using an open-ended rectangular waveguide and an embedded PIN diode-loaded dipole probe. This technique has been further explored in a unique application utilizing the complex ratio of dynamic reflection coefficients for the two states of the modulated dipole probe. By utilizing this ratio, the calculation of dielectric properties becomes independent of measurement parameters such as distance, orientation, and location of the dipole probe relative to the waveguide radiator. This paper explores this unique application of the embedded modulated scatterer technique and presents both theoretical and experimental results for evaluating complex dielectric properties of materials
Recommended Citation
G. S. Freiburger and R. Zoughi, "Determination of Microwave Dielectric Properties of Materials using a Unique Application of Embedded Modulated Scatterer Technique," Proceedings of the Review of Progress in Quantitative Nondestructive Evaluation (2005, Brunswick, ME), vol. 820, pp. 1217 - 1222, American Institute of Physics (AIP), Aug 2005.
The definitive version is available at https://doi.org/10.1063/1.2184663
Meeting Name
Review of Progress in Quantitative Nondestructive Evaluation (2005, Jul. 31-Aug. 5, Brunswick, ME)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Dielectric Properties; Nondestructive Testing; Probes; Rectangular Waveguides; Dielectric Material Characterization; Embedded Sensors; Microwaves; Modulated Scatterer
International Standard Book Number (ISBN)
978-0735403123
International Standard Serial Number (ISSN)
0094-243X
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2005 American Institute of Physics (AIP), All rights reserved.
Publication Date
01 Aug 2005
