Recommended Citation
W. K. Al-Assadi et al., "Use of Storage Elements as Primitives for Modeling Faults in Synchronous Sequential Circuits," Proceedings of the 6th International Conference on VLSI Design, 1993, Institute of Electrical and Electronics Engineers (IEEE), Jan 1993.
The definitive version is available at https://doi.org/10.1109/ICVD.1993.669660
Meeting Name
6th International Conference on VLSI Design, 1993
Department(s)
Electrical and Computer Engineering
International Standard Serial Number (ISSN)
1063-9667
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 1993 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 1993
