Abstract
A modeling approach for incorporating a two-port network with S-parameters in the finite-difference time-domain (FDTD) method is reported in this paper. The proposed method utilizes the time-domain Y-parameters to describe the network characteristics, and incorporates the Y-parameters into the FDTD algorithm. The generalized pencil-of-function (GPOF) technique is applied to improve the memory efficiency of this algorithm by generating a complex exponential series for the Y-parameters and using recursive convolution in the FDTD updating equations. A modeling example is given, which shows that this approach is effective and accurate. This modeling technique can be extended for incorporating any number of N-port networks in the FDTD modeling.
Recommended Citation
X. Ye and J. L. Drewniak, "Incorporating Two-Port Networks with S-Parameters into FDTD," IEEE Microwave and Wireless Components Letters, vol. 11, no. 2, pp. 77 - 79, Institute of Electrical and Electronics Engineers (IEEE), Feb 2001.
The definitive version is available at https://doi.org/10.1109/7260.914308
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
FDTD; Maxwell Equation; Maxwell Equations; N-Port Networks; S-Parameters; Algorithm Memory Efficiency; Circuit Analysis Computing; Complex Exponential Series; Computational Complexity; Convolution; Equivalent Circuits; Equivalent Lumped Element Circuit Model; Fast Fourier Transforms; Finite Difference Time-Domain Analysis; Generalized Pencil-Of-Function Technique; Inverse FFT; Microstrip Circuit; Microstrip Circuits; Modeling Approach; Network Characteristics; Nonlinear Network Analysis; Recursive Convolution; Time-Domain Y-Parameters; Time-Domain Series; Two-Port Networks; Updating Equations; FDTD Method; Generalized Pencil-Of-Function (GPOF); S-Parameters
International Standard Serial Number (ISSN)
1531-1309; 1558-1764
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2001 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Feb 2001