System level ESD failure mechanisms, analysis and test method

Author

Kai Wang

Abstract

"This dissertation, composed of four papers, discusses three topics related to system level electrostatic discharge. In the first paper, the discharge current and the transient fields of an ESD generator in the contact mode are numerically simulated using the FDTD method...The second and the third papers derived a reference ESD event for human-metal ESD from measured discharges...In the fourth paper, a three dimensional ESD scanning system which has been developed to record the ESD susceptibility map for printed circuit board is presented and the mechanisms that the ESD event couples into the digital devices is studied"--Abstract, page iv.

Department(s)

Electrical and Computer Engineering

Degree Name

Ph. D. in Electrical Engineering

Publisher

University of Missouri--Rolla

Publication Date

Fall 2005

Journal article titles appearing in thesis/dissertation

• Numerical modeling of electrostatic discharge generator
• Characterization of human-metal ESD reference discharge event and correlation of generator parameters to failure levels. Part I: Reference event
• Characterization of human-metal ESD reference discharge event and correlation of generator parameters to failure levels. Part II: Correlation of generator parameters to failure levels
• ESD susceptibility characterization of a EUT by using 3D ESD scanning system

Pagination

xiv, 93 pages

Note about bibliography

Includes bibliographical references.

Rights

© 2005 Kai Wang, All rights reserved.

Document Type

Dissertation - Citation

File Type

text

Language

English

Subject Headings

ElectrostaticsElectric dischargesMetal oxide semiconductors, ComplementaryFinite differencesTime-domain analysis

Thesis Number

T 8851

Print OCLC #

83600205

Recommended Citation

Wang, Kai, "System level ESD failure mechanisms, analysis and test method" (2005). Doctoral Dissertations. 1657.
https://scholarsmine.mst.edu/doctoral_dissertations/1657