Fault-Aware Sensitivity Analysis for Probabilistic Real-Time Systems

Abstract

In probabilistic real-time modeling, diverse task execution conditions can be characterized with probabilistic distributions, where multiple execution time thresholds are represented, each with an exceeding probability. Comparing to traditional deterministic real-time, probabilistic approaches provide more flexibility in system behavior modeling, which may result in more precise schedulability analysis. With this work, we combine sensitivity analysis and probabilistic models of fault effects on task execution behaviors. The goal is to develop probabilistic schedulability analysis that is applicable to both faulty and non-faulty execution conditions. While the probabilities accurately characterize faults and faults effects on worst-case execution times, the probabilistic schedulability analysis both qualifies and quantifies faults impacts on system schedulability.

Meeting Name

2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016 (2016: Sep. 19-20, Storrs, CT)

Department(s)

Computer Science

Research Center/Lab(s)

Intelligent Systems Center

Keywords and Phrases

Defects; Fault Tolerance; Interactive Computer Systems; Nanotechnology; Probability Distributions; Sensitivity Analysis; VLSI Circuits

International Standard Book Number (ISBN)

978-1-5090-3623-3

International Standard Serial Number (ISSN)

2377-7966

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Sep 2016

Link to Full Text

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