VLSI Self-Testing Based on Syndrome Techniques

Author

Zeev Barzilai
Jacob Savir
George Markowsky, Missouri University of Science and TechnologyFollow
Merlin G. Smith

Recommended Citation

Z. Barzilai et al., "VLSI Self-Testing Based on Syndrome Techniques," Proceedings of the International Test Conference (1981, Philadelphia, PA), pp. 102 - 109, International Test Conference, Oct 1981.

Meeting Name

International Test Conference (1981: Oct., Philadelphia, PA)

Department(s)

Computer Science

Keywords and Phrases

Architecture; IC Testing; LSI; Macros; Self-testing; Syndrome Techniques; VLSI; Weighted Syndromes; Integrated Circuits

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 1981 International Test Conference, All rights reserved.

Publication Date

01 Oct 1981