Abstract
The integration of object oriented modeling and structured analysis (SA) for developing a well structured object oriented software system is a challenge for requirements analysts and software designers. Some of the existing object oriented modeling techniques adopt approaches that are very different from SA, and others have clumsily stayed with SA after a few modifications. Our High Order Object Modeling Technique (HOOMT) however, attempts to strike a mean between both extremes while at the same time provides an effective modeling method. HOOMT consists of two models, the High Order Object Model and the Object Information Flow Model. By using the familiar divide and conquer concept and functional decomposition, our approach also ensures a less stressful migration of SA analysts to object oriented platforms. The paper introduces HOOMT, its concepts, and notations.
Recommended Citation
X. F. Liu and H. Lin, "High-Order Object Model Based Software Analysis," Proceedings of the 21st Annual International Computer Software and Applications Conference, 1997, Institute of Electrical and Electronics Engineers (IEEE), Jan 1997.
The definitive version is available at https://doi.org/10.1109/CMPSAC.1997.624800
Meeting Name
21st Annual International Computer Software and Applications Conference, 1997
Department(s)
Computer Science
Keywords and Phrases
HOOMT; High Order Object Model; High Order Object Modeling Technique; Object Information Flow Model; SA Analysts; Divide and Conquer Concept; Divide and Conquer Methods; Functional Decomposition; High Order Object Model Based Software Analysis; Object Oriented Modeling; Object Oriented Modeling Techniques; Object Oriented Platforms; Object-Oriented Methods; Object-Oriented Programming; Requirements Analysts; Software Designers; Structured Analysis; Structured Programming; Well Structured Object Oriented Software System
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 1997 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 1997
