Abstract
The software process needs to be continuously improved to develop high quality software. However, with increasing specialization in the workforce and decentralization in the workplace, software process planning, monitoring, analysis and dynamic tuning in a heterogeneous distributed environment becomes a challenge. We describe a tool which takes advantage of emerging Internet technology to implement a software metrics environment for software process management and software quality improvement. The tool uses a dimensional analytic model to visualize the software development process. The system offers facilities to monitor the status and quality attributes of projects being developed at multiple sites and on multiple platforms based on Internet, Java, JDBC and a database system.
Recommended Citation
X. F. Liu and R. Viswanathan, "A WWW Based Software Metrics Environment for Software Process Management and Software Product Quality Improvement," Proceedings of the 23rd Annual International Computer Software and Applications Conference, 1999, Institute of Electrical and Electronics Engineers (IEEE), Jan 1999.
The definitive version is available at https://doi.org/10.1109/CMPSAC.1999.812721
Meeting Name
23rd Annual International Computer Software and Applications Conference, 1999
Department(s)
Computer Science
Keywords and Phrases
Internet; Internet Technology; JDBC; Java; WWW Based Software Metrics Environment; Database System; Dimensional Analytic Model; Dynamic Tuning; Heterogeneous Distributed Environment; High Quality Software; Information Resources; Multiple Platforms; Multiple Sites; Program Visualisation; Quality Attributes; Software Development Management; Software Development Process; Software Metrics; Software Metrics Environment; Software Process Improvement; Software Process Management; Software Process Planning; Software Product Quality Improvement; Software Quality; Software Quality Improvement; Workplace
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 1999 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 1999