Abstract
Silent data corruption poses a significant risk to the integrity of data in storage systems. Although error correction codes (ECC) can recover the majority of such errors, a nonnegligible portion of them escape ECC, referred as uncorrectable errors (UEs). Despite being rare in nature, increasing scale of storage systems and fast-growing I/O rates decreased the mean time between UEs from months to hours. Yet, unlike disk failures, UEs are hard to predict with high precision, making it difficult to adopt proactive measures. In this paper, we introduce a probabilistic approach to deploy UE mitigation strategies that can capture significant portion of UE while keeping the system overhead at a tolerable range. To achieve this, we first estimate the probability of I/O operations to be exposed to UEs and find a minimum subset of disks for which employing UE avoidance strategies can lead to significant decrease in UE exposure. We demonstrate through extensive simulations that when the proposed probabilistic model is used to implement write verification strategy to detect and recover from UEs, more than 50% of all write-triggered UEs can be avoided with 1% read overhead, and more than 70% of UEs can be mitigated with less than 3.5% read overhead. We further measure the impact of incurred read overhead on write performance in production Lustre and GPFS file systems and validate our findings that more than half of UEs can be avoided while degrading writes I/O throughout by less than 0.9%.
Recommended Citation
M. Arifuzzaman et al., "Be Smart, Save I/o: A Probabilistic Approach to Avoid Uncorrectable Errors in Storage Systems," 2022 IEEE International Conference on Cluster Computing (CLUSTER), Institute of Electrical and Electronics Engineers, Sep 2022.
The definitive version is available at https://doi.org/10.1109/cluster51413.2022.00038
Department(s)
Computer Science
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Sep 2022