"Message From The IEEE MDM 2023 Test-of-Time Committee" by Christian S. Jensen, Sanjay Kumar Madria et al.
 

Department(s)

Computer Science

International Standard Serial Number (ISSN)

1551-6245

Document Type

Editorial

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

01 Jan 2023

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