Title

Measurement Techniques to Predict the Soft Failure Susceptibility of an IC Without the Aid of a Complete Software Stack

Abstract

In this paper, several methods are outlined for detecting functional changes in an IC due to external interference such as ESD or EMI. The goal is to provide diagnostic tools for detection of potential soft failure susceptibilities of complex systems during the hardware design stage without the aid of any complex software.

Meeting Name

2016 IEEE International Symposium on Electromagnetic Compatibility (2016: Jul. 25-29, Ottawa, Canada)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Electrostatic devices; Electrostatic discharge; Integrated circuits; Testing; Complex software; Diagnostic tools; External interference; Functional changes; Hardware design; Measurement techniques; Soft failure; Software stacks; Electromagnetic compatibility; EMI; ESD

International Standard Book Number (ISBN)

978-150901441-5

International Standard Serial Number (ISSN)

1077-4076

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.


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