Abstract

An effective method for extracting parameters of a Debye or a Lorentzian dispersive medium over a wideband frequency range using a genetic algorithm (GA) and a transmission-line model is presented. Scattering parameters (S-parameters) of the transmission-line sections, including a parallel plate, microstrip, and stripline, are measured. Wave equations for TEM/quasi-TEM mode with a complex propagation constant and a frequency-dependent wave impedance are used to evaluate the corresponding S-parameters in an analytical model. The discrepancy between the modeled and measured S-parameters is defined as the objective function in the GA. The GA is used for search of the dispersive-medium parameters by means of minimizing the objective function over the entire frequency range of interest. The reconstructed Debye or Lorentzian dispersive material parameters are corroborated by comparing the original measurements with the FDTD modeling results. The self-consistency of the proposed method is demonstrated by constructing different test structures with an identical material, i.e., material parameters of a substrate extracted from different transmission-line configurations. The port effects on the material parameter extraction are examined by using through-reflection-line calibration.

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Electromagnetic Propagation In Dispersive Media; Finite-Difference Time-Domain (FDTD) Methods; Genetic Algorithms (GAs); Scattering Parameters; Transmission Lines; Algorithms; Boolean Functions; Chlorine Compounds; Dielectric Properties; Electric Lines; Finite Difference Time Domain Method; Numerical Analysis; Parameter Extraction; Scattering Parameters; Substrates; Ultrashort Pulses; Wave Equations; S-Parameters; Parameter Estimation

International Standard Serial Number (ISSN)

0018-9375; 1558-187X

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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