System level ESD failure mechanisms, analysis and test method
"This dissertation, composed of four papers, discusses three topics related to system level electrostatic discharge. In the first paper, the discharge current and the transient fields of an ESD generator in the contact mode are numerically simulated using the FDTD method...The second and the third papers derived a reference ESD event for human-metal ESD from measured discharges...In the fourth paper, a three dimensional ESD scanning system which has been developed to record the ESD susceptibility map for printed circuit board is presented and the mechanisms that the ESD event couples into the digital devices is studied"--Abstract, leaf iv.
Electrical and Computer Engineering
Ph. D. in Electrical Engineering
University of Missouri--Rolla
Journal article titles appearing in thesis/dissertation
- Numerical modeling of electrostatic discharge generator
- Characterization of human-metal ESD reference discharge event and correlation of generator parameters to failure levels. Part I: Reference event
- Characterization of human-metal ESD reference discharge event and correlation of generator parameters to failure levels. Part II: Correlation of generator parameters to failure levels
- ESD susceptibility characterization of a EUT by using 3D ESD scanning system
xiv, 93 leaves
© 2005 Kai Wang, All rights reserved.
Dissertation - Citation
Library of Congress Subject Headings
Metal oxide semiconductors, Complementary
Print OCLC #
Link to Catalog Record
Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://laurel.lso.missouri.edu/record=b5787026~S5
Wang, Kai, "System level ESD failure mechanisms, analysis and test method" (2005). Doctoral Dissertations. 1657.