Abstract
The recent theoretical progress in studying the x-ray emission from highly-charged, few-electron ions is reviewed. These case studies show that relativistic, high-Z ions provide a unique tool for better understanding the interplay between the electron-photon and electron-electron interactions in strong fields. Most naturally, this interplay is probed by the radiative capture of a (quasi-) free electron into the bound states of projectile ions, and by varying the charge state and the energy of the projectiles. For the capture into initially hydrogen-and lithium-like ions, here we summarize the recent results for the angular distribution and polarization of the recombination photons as well as the subsequent Kα emission, if the electron is captured into an excited state of the ion.
Recommended Citation
S. Fritzsche et al., "Angular and Polarization Analysis of X-Rays Emitted from Highly-Charged, Few-Electron Ions," Journal of Physics: Conference Series, vol. 88, no. 1, IOP Publishing, Nov 2007.
The definitive version is available at https://doi.org/10.1088/1742-6596/88/1/012018
Meeting Name
XXV International Conference on Photonic, Electronic and Atomic Collisions (2007: Jul. 25-31, Freiburg, Germany)
Department(s)
Physics
International Standard Serial Number (ISSN)
1742-6588
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2007 IOP Publishing, All rights reserved.
Publication Date
01 Nov 2007
