Thermal Conductivity in Nanocrystalline Ceria Thin Films
Abstract
The thermal conductivity of nanocrystalline ceria films grown by unbalanced magnetron sputtering is determined as a function of temperature using laser-based modulated thermoreflectance. The films exhibit significantly reduced conductivity compared with stoichiometric bulk CeO2. A variety of microstructure imaging techniques including X-ray diffraction, scanning and transmission electron microscopy, X-ray photoelectron analysis, and electron energy loss spectroscopy indicate that the thermal conductivity is influenced by grain boundaries, dislocations, and oxygen vacancies. The temperature dependence of the thermal conductivity is analyzed using an analytical solution of the Boltzmann transport equation. The conclusion of this study is that oxygen vacancies pose a smaller impediment to thermal transport when they segregate along grain boundaries.
Recommended Citation
M. Khafizov and I. W. Park and A. V. Chernatynskiy and L. F. He and J. L. Lin and J. J. Moore and D. Swank and T. M. Lillo and S. R. Phillpot and A. A. El-Azab and D. H. Hurley, "Thermal Conductivity in Nanocrystalline Ceria Thin Films," Journal of the American Ceramic Society, vol. 97, no. 2, pp. 562 - 569, Blackwell Publishing Inc., Feb 2014.
The definitive version is available at https://doi.org/10.1111/jace.12673
Department(s)
Physics
Research Center/Lab(s)
Center for High Performance Computing Research
International Standard Serial Number (ISSN)
0002-7820
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2014 Blackwell Publishing Inc., All rights reserved.
Publication Date
01 Feb 2014
