Lattice Defects in Nanocrystalline CeO2 Thin Films
Abstract
The results of Raman scattering studies of nanocrystalline CeO2 thin films are presented. The spectra have been described using the spatial correlation model from which the coherence length has been determined as a function of grain size. A direct comparison between the concentration of defects related to coherence length and microstructure of CeO2 has been achieved.
Recommended Citation
I. Kosacki et al., "Lattice Defects in Nanocrystalline CeO2 Thin Films," Radiation Effects and Defects in Solids, vol. 156, no. 1, pp. 109 - 115, Taylor and Francis Group; Taylor and Francis, Jan 2001.
The definitive version is available at https://doi.org/10.1080/10420150108216880
Department(s)
Physics
Second Department
Materials Science and Engineering
Keywords and Phrases
Ceria; Nanomaterials; Nonstoichiometry; Raman scattering; Thin films
International Standard Serial Number (ISSN)
1042-0150
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Taylor and Francis Group; Taylor and Francis, All rights reserved.
Publication Date
01 Jan 2001
