Threshold Displacement Energies And Primary Radiation Damage In AlN From Molecular Dynamics Simulations

Abstract

Aluminum nitride (AlN) is an attractive material for sensing application in radiation environments owing to its radiation resistance, optical wide-bandgap, and piezoelectric properties. Yet, the variations of its physical properties under exposure to energetic particle needs to be better understood. Here, we report the results of the molecular dynamics simulations of the structural changes in AlN under irradiation via the knock-on atom technique. By creating and evolving irradiation cascades due to energetic particle interactions with the atoms of the crystalline lattice, we determine the rate of defect production as a function of the deposited energy. Further, we determine the threshold displacement energy, a key characteristic that describes how efficient the defect production in the given material is. We find that displacement threshold is slightly greater than isostructural gallium nitride and is lower than metal oxides used in radiation environments.

Department(s)

Physics

Comments

U.S. Department of Energy, Grant DE-NE0008811

Keywords and Phrases

Aluminum nitride; Molecular dynamics; Radiation damage; Threshold displacement energy

International Standard Serial Number (ISSN)

0168-583X

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Elsevier, All rights reserved.

Publication Date

01 Feb 2024

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