Ion-X-ray Coincidence Measurements In Heavy Ion Collisions
X-ray emission associated with projectile charge-changing events in fast ion-atom collisions can be used to isolate and investigate excitation, ionization and charge transfer, as well as combinations of these processes. The major emphasis to date has been on the study of two-electron processes. Several such processes have been studied in detail. Resonant and nonresonant transfer and excitation (RTE and NTE) occur when electron capture and projectile excitation, with stabilization by X-ray emission, take place together in a single collision. Loss and excitation (LE) occurs when a projectile electron is removed and the ion is excited in a single collision. The cross sections for loss and excitation have been measured for a wide range of highly stripped projectiles over a broad energy range. The results shed light on projectile K X-ray production processes in heavy-ion collisions. The use of ion-X-ray coincidence techniques in exploring these and other collision processes will be discussed. © 1987.
W. G. Graham and E. M. Bernstein and M. W. Clark and J. A. Tanis and K. H. Berkner and A. S. Schlachter and J. W. Stearns and B. M. Johnson and K. W. Jones and M. Meron and R. H. McFarland and T. J. Morgan and M. P. Stockli, "Ion-X-ray Coincidence Measurements In Heavy Ion Collisions," Nuclear Inst. and Methods in Physics Research, B, vol. 24 thru 25, no. PART 1, pp. 69 - 73, Elsevier, Apr 1987.
The definitive version is available at https://doi.org/10.1016/0168-583X(87)90591-X
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03 Apr 1987