Ion-X-ray Coincidence Measurements In Heavy Ion Collisions

Abstract

X-ray emission associated with projectile charge-changing events in fast ion-atom collisions can be used to isolate and investigate excitation, ionization and charge transfer, as well as combinations of these processes. The major emphasis to date has been on the study of two-electron processes. Several such processes have been studied in detail. Resonant and nonresonant transfer and excitation (RTE and NTE) occur when electron capture and projectile excitation, with stabilization by X-ray emission, take place together in a single collision. Loss and excitation (LE) occurs when a projectile electron is removed and the ion is excited in a single collision. The cross sections for loss and excitation have been measured for a wide range of highly stripped projectiles over a broad energy range. The results shed light on projectile K X-ray production processes in heavy-ion collisions. The use of ion-X-ray coincidence techniques in exploring these and other collision processes will be discussed. © 1987.

Department(s)

Physics

Comments

U.S. Department of Energy, Grant None

International Standard Serial Number (ISSN)

0168-583X

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2023 Elsevier, All rights reserved.

Publication Date

03 Apr 1987

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