Abstract
The shape of the energy distribution of scattered particles in an active beam scattering experiment can be influenced considerably by the presence of highly charged impurity ions in the plasma. In this work it is shown theoretically that multiply charged impurities have only a small effect on the scattering distribution at low energies (/amu) and at high energies (>75 keV/amu). The effect of the impurities is the most pronounced for energies close to 50 keV/amu. The results of the calculations are in good agreement with experimental results at various energies. Extrapolation to higher beam energies leads to the conclusion that the active beam scattering diagnostics can be applied also in future fusion devices for measuring the local ion temperature.
Recommended Citation
A. J. Donné et al., "The Role Of Small-impact-parameter Electron-loss Processes On Ion Temperatures Measured By Active-beam Plasma Diagnostics," Journal of Applied Physics, vol. 65, no. 1, pp. 57 - 63, American Institute of Physics, Dec 1989.
The definitive version is available at https://doi.org/10.1063/1.343375
Department(s)
Physics
International Standard Serial Number (ISSN)
0021-8979
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2023 American Institute of Physics, All rights reserved.
Publication Date
01 Dec 1989
