Abstract

A beam of atoms penetrating a plasma can be considered a line source of contaminants. Atoms excited by the plasma electrons yield information about the spatially resolved electron density and temperature. The light intensity as a function of time and position along the beam can be conveniently observed with an optical multichannel analyzer Since the beam atoms are different from the plasma constituents, the method does not suffer from self-absorption. Copyright © 1977 by The Institute of Electrical and Electronics Engineers, Inc.

Department(s)

Physics

International Standard Serial Number (ISSN)

1939-9375; 0093-3813

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

01 Jan 1977

Included in

Physics Commons

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