Extreme Sensitivity in Trace Element Detection
A technique is demonstrated which can detect extremely low levels of trace elements. This technique uses multicolor, selective multiphoton ionization of a trace impurity species followed by ion-induced nucleation in a supersaturated vapor, which allows the detection of single ions at atmospheric pressures. The combination of these two processes has the potential for use in detection of a wide range of atmospheric contaminants at extremely low levels. This technique is demonstrated by the detection of mercury atoms at a concentration of less than 1 part per 1014 particles.
H. N. Ereifej et al., "Extreme Sensitivity in Trace Element Detection," Applied Physics B: Lasers and Optics, vol. 68, no. 1, pp. 141-144, Springer Verlag, Jan 1999.
The definitive version is available at https://doi.org/10.1007/s003400050598
Keywords and Phrases
Atmospheric pressure; Impurities; Ionization; Mercury (metal); Trace analysis; Vapors; Multiphoton ionization; Trace elements
International Standard Serial Number (ISSN)
Article - Journal
© 1999 Springer Verlag, All rights reserved.
01 Jan 1999