Extreme Sensitivity in Trace Element Detection

Author

Heider N. Ereifej
G. Jay Doster, Missouri University of Science and Technology
John L. Schmitt, Missouri University of Science and TechnologyFollow
J. Greg Story, Missouri University of Science and TechnologyFollow

Abstract

A technique is demonstrated which can detect extremely low levels of trace elements. This technique uses multicolor, selective multiphoton ionization of a trace impurity species followed by ion-induced nucleation in a supersaturated vapor, which allows the detection of single ions at atmospheric pressures. The combination of these two processes has the potential for use in detection of a wide range of atmospheric contaminants at extremely low levels. This technique is demonstrated by the detection of mercury atoms at a concentration of less than 1 part per 10¹⁴ particles.

Recommended Citation

H. N. Ereifej et al., "Extreme Sensitivity in Trace Element Detection," Applied Physics B: Lasers and Optics, vol. 68, no. 1, pp. 141 - 144, Springer Verlag, Jan 1999.

The definitive version is available at https://doi.org/10.1007/s003400050598

Department(s)

Physics

Keywords and Phrases

Atmospheric pressure; Impurities; Ionization; Mercury (metal); Trace analysis; Vapors; Multiphoton ionization; Trace elements

International Standard Serial Number (ISSN)

0946-2171

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 1999 Springer Verlag, All rights reserved.

Publication Date

01 Jan 1999