Spin Polarized Current Injection Through HgBr₂ Intercalated Bi2212 Intrinsic Josephson Junctions
Abstract
To investigate the effect of polarized current on tunneling characteristics of intrinsic Josephson junctions (IJJs), spin-polarized and spin-degenerate current have been injected through the c-axis of HgBr2 intercalated Bi2.1Sr1.5Ca1.4Cu2O 8+δ (Bi2212) single crystals on which 10 x 10 μm 2 mesas have been fabricated. These two spin conditions are achieved by depositing either Au (15 nm)/Co (80 nm)/Au (156 nm) multilayers or single Au film on HgBr2 intercalated Bi2212 with Tc = 74 K followed by photolithography and Ar ion beam etching. The I-V characteristics have been measured with and without a magnetic field parallel to c-axis at 4.2 K. A fine, soft Au wire is used to make a gentle mechanical contact on the top of a particular mesa in the array. Tunneling conductance characteristics were obtained and the magnetic field dependence of sumgap voltage peaks was investigated. These peaks do not change in position with increasing magnetic field for both contact configurations. In addition, the temperature dependence of tunneling characteristics of the IJJs are obtained and existence of pseudogap feature is observed above Tc for HgBr2 intercalated Bi2212.
Recommended Citation
L. Ozyuzer et al., "Spin Polarized Current Injection Through HgBr₂ Intercalated Bi2212 Intrinsic Josephson Junctions," IEEE Transactions on Applied Superconductivity, vol. 17, no. 2, pp. 577 - 580, Institute of Electrical and Electronics Engineers (IEEE), Jun 2007.
The definitive version is available at https://doi.org/10.1109/TASC.2007.898651
Department(s)
Physics
Second Department
Geosciences and Geological and Petroleum Engineering
Keywords and Phrases
Bismuth compounds; Josephson junction devices; Magnetic fields; Single crystals; Spin polarization; Intrinsic josephson junctions; Pseudogap; Spin polarized current; Electron injection
International Standard Serial Number (ISSN)
1051-8223
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jun 2007