Thermal Management in Large Bi2212 Mesas Used for Terahertz Sources

Author

Cihan Kurter, Missouri University of Science and TechnologyFollow
Kenneth E. Gray, Missouri University of Science and TechnologyFollow
John F. Zasadzinski
Lutfi Ozyuzer
Alexei E. Koshelev
Qing'an Li
T. Yamamoto
Kazuo Kadowaki
Wai-Kwong Kwok
M. Tachiki
Ulrich Welp

Abstract

We present a thermal analysis of a patterned mesa on a Bi ₂Sr₂CaCu₂O₈ (Bi2212) single crystal that is based on tunneling characteristics of the c-axis stack of ~800 intrinsic Josephson junctions in the mesa. Despite the large mesa volume (e.g., 40 x 300 x 1.2 μm³) and power dissipation that result in self-heating and backbending of the current-voltage curve (I-V), there are accessible bias conditions for which significant polarized THz-wave emission can be observed. We estimate the mesa temperature by equating the quasiparticle resistance, R_qp(T), to the ratio V/I over the entire I-V including the backbending region. These temperatures are used to predict the unpolarized black-body radiation reaching our bolometer and there is substantial agreement over the entire I-V. As such, backbending results from the particular R _qp (T) for Bi2212, as first discussed by Fenton, rather than a significant suppression of the energy gap. This model also correctly predicts the observed disappearance of backbending above ~60 K.

Recommended Citation

C. Kurter and K. E. Gray and J. F. Zasadzinski and L. Ozyuzer and A. E. Koshelev and Q. Li and T. Yamamoto and K. Kadowaki and W. Kwok and M. Tachiki and U. Welp, "Thermal Management in Large Bi2212 Mesas Used for Terahertz Sources," IEEE Transactions on Applied Superconductivity, vol. 19, no. 3, pp. 428 - 431, Institute of Electrical and Electronics Engineers (IEEE), Jun 2009.

The definitive version is available at https://doi.org/10.1109/TASC.2009.2019235

Department(s)

Physics

Second Department

Geosciences and Geological and Petroleum Engineering

Keywords and Phrases

A-thermal; Bi-2212; Bi2sr2CaCu2o8 (Bi2212) crystals; Bias conditions; Current voltage curve; Intrinsic Josephson junction; Intrinsic josephson junctions; Mesa structure; Patterned mesas; Power dissipation; Quasi particles; Self-heating; Terahertz emission; Terahertz sources; Thermal management; Tunneling characteristics; Wave emissions; Electric potential; Heating; Josephson junction devices; Joule heating; Single crystals; Thermoanalysis; Crystal structure

International Standard Serial Number (ISSN)

1051-8223

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Jun 2009