Photoelectron Spectroscopy of U Oxide at LLNL
Abstract
X-ray photoelectron spectroscopy has been used to characterize a sample of UO 2 grown on an underlying substrate of Uranium. Both AlKα (1487 eV) and MgKα (1254 eV) emission were utilized as the excitation.
Recommended Citation
J. G. Tobin et al., "Photoelectron Spectroscopy of U Oxide at LLNL," Materials Research Society Symposium Proceedings, vol. 1264, pp. 151 - 156, Materials Research Society (MRS), Apr 2010.
The definitive version is available at https://doi.org/10.1557/PROC-1264-Z11-06
Meeting Name
MRS Spring Meeting (2010: Apr. 5-9, San Francisco, CA)
Department(s)
Physics
Keywords and Phrases
Electrons; Photoelectricity; Photons; Uranium; X ray photoelectron spectroscopy; Oxide
International Standard Book Number (ISBN)
978-1605112411
International Standard Serial Number (ISSN)
0272-9172
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2010 Materials Research Society (MRS), All rights reserved.
Publication Date
01 Apr 2010