Abstract
Utilizing microwave reflections to compare a reference device with counterfeit and/or aging devices under test. The reflection from the device under test varies based on certain properties, which results in each device having a unique and intrinsic electromagnetic signature. Comparisons of the electromagnetic signature of the device under test to the electromagnetic signature of a reference device enable evaluating the acceptability of the device under test.
Recommended Citation
Ghasr, Mohammad Tayeb; Zoughi, Reza; Shinde, Satyajeet; and Jothibasu, Sasi, "Microwave Reflectometry for Physical Inspections" (2021). Patents. 4.
https://scholarsmine.mst.edu/patents/4
Department(s)
Electrical and Computer Engineering
Patent Application Number
16/326,529
Patent Number
US 10,921,264 B2
Document Type
Patent
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2026 The Curators of the University of Missouri, All rights reserved
Additional Rights Information
Assignee: The Curators of the University of Missouri, Columbia, Missouri (US)
Publication Date
16 February, 2021
Comments
Docket Number: 16MST029-UTL
Filing Date: 02/19/2019
Issue Date: 02/16/2021, FY21
References Cited
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Prior Publication Data: US 2019/0227003 A1 July 25, 2019