"Ultra-low Fluence Irradiation with Energetic Heavy Ion Pulsed Beam usi" by Joseph T. Graham, José Olivares et al.
 

Ultra-low Fluence Irradiation with Energetic Heavy Ion Pulsed Beam using a Modified Electrostatic Raster Scanner

Abstract

A method for performing low fluence pulsed irradiations with energetic heavy ions is presented. A raster scanner, placed upstream from a sample target chamber, is externally driven by a voltage pulse generated by a function generator. The configuration is similar to an electrostatic chopper, where a voltage difference across the scanner's electrodes sweeps the beam across the sample, placed slightly off center from the beam axis, resulting in a short irradiation pulse on the sample and a low particle fluence. Such a system was developed at the Centre for Micro Analysis of Materials (CMAM) facility and characterized using 9 MeV F and 18 MeV Cl ions. The system can generate pulses of a few microseconds duration, depending on ion energy and charge state. A diagnostic method for measuring the fluence on the samples by counting etched ion tracks is described. A fluence on the order of 106 cm−2 was obtained by this method. This method could be adopted by other tandem ion accelerator facilities through simple and inexpensive modifications of existing beam handling instruments.

Department(s)

Nuclear Engineering and Radiation Science

Comments

Universidad Autónoma de Madrid, Grant IMP030/23

Keywords and Phrases

electrostatic chopping; ion fluence measurement; ion track etching; pulsed ion irradiation; swift ions

International Standard Serial Number (ISSN)

1402-4896; 0031-8949

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2025 IOP Publishing; Royal Swedish Academy of Sciences, All rights reserved.

Publication Date

01 Mar 2025

Link to Full Text

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