Anti-scatter Grid Evaluation for Wide-cone CT
Abstract
Scatter is a significant source of image artifacts in wide-cone CT. Scatter management includes both scatter rejection and scatter correction. The common scatter rejection approach is to use an anti-scatter grid (ASG). Conventional CT scanners (with detector coverage not exceeding 40mm along the patient axis) typically employ one-dimensional (1D) ASGs. Such grids are quite effective for small cone angles. For larger cone angles, however, simply increasing the aspect ratio of a 1D ASG is not sufficient. In addition, a 1D ASG offers no scatter rejection along the patient axis. To ensure adequate image quality in wide-cone CT, a two-dimensional (2D) ASG is needed. In this work, we measured the amount of scatter and the degree of image artifacts typically attributable to scatter for four prototype 2D ASG designs, and we compared those to a 1D ASG. The scatter was measured in terms of the scatter-toprimary ratio (SPR). The cupping and ghosting artifacts were assessed through quantitative metrics. For the 2D ASGs, when compared to the 1D ASG, the SPR decreased by up to 66% and 75% for 35cm water and 48cm polyethylene, respectively, phantoms, at 80-160mm apertures (referenced to isocenter), as measured by the pinhole method. As measured by the two-aperture method, the SPR reduction was 59%-68% at isocenter for the 35cm water phantom at 160mm aperture. The cupping artifact was decreased by up to 80%. The ghosting artifact was reduced as well. The results of the evaluation clearly demonstrate the advantage of using a 2D ASG for wide-cone CT. © 2014 SPIE.
Recommended Citation
R. Melnyk et al., "Anti-scatter Grid Evaluation for Wide-cone CT," Progress in Biomedical Optics and Imaging - Proceedings of SPIE, vol. 9033, article no. 90332P, Society of Photo-optical Instrumentation Engineers, Jan 2014.
The definitive version is available at https://doi.org/10.1117/12.2043619
Department(s)
Nuclear Engineering and Radiation Science
Keywords and Phrases
anti-scatter grid; scatter rejection; wide-cone CT
International Standard Book Number (ISBN)
978-081949826-7
International Standard Serial Number (ISSN)
1605-7422
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Society of Photo-optical Instrumentation Engineers, All rights reserved.
Publication Date
01 Jan 2014