Maximizing Resolution of the High-Speed Photography of Explosive-Driven Power Generator (EDPG) Armatures in Operation
Editor(s)
Rakowski, Z.
Abstract
An integral part of the Explosive-Driven Power Generation Program is to enhance the quality and resolution of photography of the surface of EDPG armatures during explosive expansion. The quality and resolution of photography are affected by the amount of illumination, its wavelength, pulse duration, shock effects from the explosive event, explosive plasmas, and surrounding atmospheric characteristics (shock generation of light, blurring, refraction, etc.). Current methods of providing illumination for very high speed photography (approximately 1×10⁶ frames per second) involve the utilization of intense light generated by explosive events such as so-called 'argon bombs;' however, such devices reduce the maximum explosive weight in the experimental device and also generate light of a less desirable wavelength. A new system was developed in-house using inexpensive equipment that allows flash photography at 1×10⁶ frames per second utilizing 100 ISO film. This equipment is described along with the techniques used to mitigate the deleterious effects of the explosive event on its surrounding environment. The resultant imaging maximizes resolution of phenomena at the armature surface, far surpassing any previously achieved at this facility.
Recommended Citation
P. N. Worsey et al., "Maximizing Resolution of the High-Speed Photography of Explosive-Driven Power Generator (EDPG) Armatures in Operation," Digest of Technical Papers-IEEE International Pulsed Power Conference, Institute of Electrical and Electronics Engineers (IEEE), Jan 1999.
The definitive version is available at https://doi.org/10.1109/PPC.1999.823715
Meeting Name
12th IEEE International Pulsed Power Conference
Department(s)
Mining Engineering
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 1999 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 1999