Numerical Modeling of Scattering Type Scanning Near-field Optical Microscopy

Abstract

Apertureless scattering-type Scanning Near-field Optical Microscopy (s-SNOM) has been used to study the electromagnetic response of infrared antennas below the diffraction limit. The ability to simultaneously resolve the phase and amplitude of the evanescent field relies on the implementation of several experimentally established background suppression techniques. We model the interaction of the probe with a patch antenna using the Finite Element Method (FEM). Green's theorem is used to predict the far-field, cross-polarized scattering and to construct the homodyne amplified signal. This approach allows study of important experimental phenomena, specifically the effects of the reference strength, demodulation harmonic, and detector location. © 2013 Copyright SPIE.

Department(s)

Mechanical and Aerospace Engineering

Keywords and Phrases

infrared antenna; numerical modeling; Scanning Near-Field Optical Microscopy

International Standard Book Number (ISBN)

978-081949665-2

International Standard Serial Number (ISSN)

1996-756X; 0277-786X

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2024 Society of Photo-optical Instrumentation Engineers, All rights reserved.

Publication Date

01 Dec 2013

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