Uniform Ultimate Boundedness of Probe-to-probe Dynamics in Dual Probe Atomic Force Microscopy
Abstract
Atomic force microscopes use a probe to interface with matter at the nanoscale through a variety of imaging or manipulation methods. A dual-probe atomic force microscope (DP-AFM) has been proposed for simultaneous imaging and manipulation. One challenge of DP-AFM is probe-to-probe contact, which may occur intentionally such as when locating one probe with the other. This work studies the stability for such interactions where the 1st probe is in the tapping mode (typically used for imaging) and 2nd probe is in the contact mode (typically used for manipulation). A state dependent switched model is proposed for DP-AFM. A theorem is proposed for uniformly ultimately bounded (UUB) stability of switched systems under a sequence nonincreasing condition and applied to the DP-AFM problem.
Recommended Citation
A. Al-Ogaidi and D. Bristow, "Uniform Ultimate Boundedness of Probe-to-probe Dynamics in Dual Probe Atomic Force Microscopy," ASME 2014 Dynamic Systems and Control Conference, DSCC 2014, vol. 1, American Society of Mechanical Engineers, Jan 2014.
The definitive version is available at https://doi.org/10.1115/dscc2014-6307
Department(s)
Mechanical and Aerospace Engineering
International Standard Book Number (ISBN)
978-079184618-6
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 American Society of Mechanical Engineers, All rights reserved.
Publication Date
01 Jan 2014
