Stochastic-Expansions-Based Model-Assisted Probability of Detection Analysis of the Spherically-Void-Defect Benchmark Problem

Abstract

Probability of detection (POD) is used for reliability analysis in nondestructive testing (NDT) area. Traditionally, it is determined by experimental tests, while it can be enhanced by physics-based simulation models, which is called model-assisted probability of detection (MAPOD). However, accurate physics-based models are usually expensive in time. In this paper, we implement a type of stochastic polynomial chaos expansions (PCE), as alternative of actual physics-based model for the MAPOD calculation. State-of-the-art least-angle regression method and hyperbolic sparse technique are integrated within PCE construction. The proposed method is tested on a spherically-void-defect benchmark problem, developed by the World Federal Nondestructive Evaluation Center. The benchmark problem is added with two uncertainty parameters, where the PCE model usually requires about 100 sample points for the convergence on statistical moments, while direct Monte Carlo method needs more than 10000 samples, and Kriging based Monte Carlo method is oscillating. With about 100 sample points, PCE model can reduce root mean square error to be within 1% standard deviation of test points, while Kriging model cannot reach that level of accuracy even with 200 sample points.

Department(s)

Mechanical and Aerospace Engineering

Keywords and Phrases

Model-assisted probability of detection; Monte Carlo sampling; Nondestructive evaluation; Spherically-void-defect; Surrogate modeling

International Standard Book Number (ISBN)

978-331993700-7

International Standard Serial Number (ISSN)

1611-3349; 0302-9743

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2023, All rights reserved.

Publication Date

01 Jan 2018

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