Robustness of a Plant-Inversion based Switched Iterative Learning Control Scheme
Abstract
This paper discusses the robustness of a plant-inversion based Switched Iterative Learning Control (SILC) scheme for a special class of multivariable systems where measurement access is limited to one output channel at any time. Previous work has shown that it is impossible for such systems to achieve zero error convergence with standard Iterative Learning Control (ILC), however, possible with SILC for appropriately designed learning matrix. The most intuitive and convenient approach to construct such a learning matrix is to directly invert the plant dynamics. Although this approach perfectly decouples the nominal plant dynamics and, thus, automatically satisfies the convergence conditions, its effectiveness when the system is contaminated with uncertainty is not examined. This work investigates the degree of robustness of this plant-inversion design to multiplicative unstructured uncertainties. The result demonstrates to what extent to which the robustness of the proposed approach is achieved.
Recommended Citation
H. Li et al., "Robustness of a Plant-Inversion based Switched Iterative Learning Control Scheme," Proceedings of the 2019 American Control Conference (2019, Philadelphia, PA), pp. 2885 - 2890, Institute of Electrical and Electronics Engineers (IEEE), Jul 2019.
The definitive version is available at https://doi.org/10.23919/ACC.2019.8814424
Meeting Name
2019 American Control Conference, ACC 2019 (2019: Jul. 10-12, Philadelphia, PA)
Department(s)
Mechanical and Aerospace Engineering
Research Center/Lab(s)
Intelligent Systems Center
Keywords and Phrases
Adaptive Control; Control System Synthesis; Iterative Learning Control; Multivariable Control Systems; Robust Control; Time-Varying Systems
International Standard Book Number (ISBN)
978-153867926-5
International Standard Serial Number (ISSN)
0743-1619
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2019 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
12 Jul 2019