Depth Profiling of Solution-deposited Lead Zirconate Titanate Thin Films by Radio Frequency Glow Discharge Atomic Emission Spectroscopy (RF-GDAES)

Abstract

Compositional depth profiles have been obtained on chemical solution deposited lead zirconate titanate (PZT) thin films using radio-frequency glow discharge atomic emission spectroscopy. The technique is very rapid, requiring less than one minute for complete multielement depth profiling of films and multilayer substrates. In the present study, the method was employed to obtain compositional profiles of the various metallic (Pb, Zr, Ti, Si) and organicrelated (C, H, 0) species that are present in the films and underlying device. Preliminary results using this relatively new technique are reported for PZT films deposited by an aqueous acetate process and heat treated at temperatures ranging from 300 and 7001C. The initial results from these investigations suggest that Pb volatilization occurs at temperatures as low as those typically encountered during the pyrolysis step. Significant interdiffusion of the Pb into the underlying Pt electrode at this temperature is also suggested. Effects of modifying ligand on film thickness and organic decomposition behavior were also observed.

Department(s)

Materials Science and Engineering

Document Type

Article - Conference proceedings

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Citation

File Type

text

Language(s)

English

Rights

© 1999 Materials Research Society, All rights reserved.

Publication Date

01 Aug 1999

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