Reliability of CaZrO3 and MgO capacitors at high temperatures

Author

• Alan Devoe
• Hung Trinh
• Fatih Dogan, Missouri University of Science and TechnologyFollow

Abstract

Calcium zirconate and magnesium oxide have both been found to have useful dielectric properties at high temperatures. Multilayer ceramic capacitors (MLCCs) were made with these dielectrics and platinum electrodes. The relationship between the lifespan (mean-time to failure) and applied voltage was determined using Weibull statistics. CaZrO₃ capacitors were tested between 550◦C and600◦C while MgO capacitors were tested between 600◦C and 650◦C. The temperature coefficient Ea and the voltage coefficient n of the Prokopowicz Vaskas equation were determined under various test conditions. Activation energiesforcalciumzirconateandmagnesiumoxidewere3.25eVand3.48eV, respectively. Resistance degradation of CaZrO₃ and MgO capacitors, tested at 600◦Cand250V, were compared.

Recommended Citation

A. Devoe et al., "Reliability of CaZrO3 and MgO capacitors at high temperatures," International of Applied Ceramic Technology, vol. 22, no. 5, American Ceramic Society, May 2025.

The definitive version is available at https://doi.org/10.1111/ijac.15180

Department(s)

Materials Science and Engineering

Publication Status

Full Access

Comments

Acknowledgements: Authors would like to thank Dr. Ian Burn for the insightful discussion, and Linda Harris for her contributions in the laboratory.

Keywords and Phrases

Capacitor; Calcium Zirconate; HALT; High temperature; Magnesium Oxide, Reliability; Resistance

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2026 American Ceramic Society, All rights reserved

Publication Date

2025-05-20