Abstract

The low-temperature dependence of the DC dielectric breakdown strength (EBD) and the energy storage density (W) of capacitors, fabricated from high purity polycrystalline strontium titanate, were investigated in the temperature range from 295 K to 77 K. Test samples were constructed with a process similar to that used for multilayer ceramic capacitors (MLCCs). The permittivity, loss tangent, leakage current, and breakdown strength were measured as a function of temperature and voltage. Weibull statistical analysis was used to quantify breakdown distributions. Despite electric-field suppression of permittivity, breakdown strength increased significantly with decreasing temperatures, leading to enhanced energy density. The breakdown field increased from approximately 440 kV/cm at 295 K to 770 kV/cm at 77 K, while the corresponding energy density rose from 2.1 J/cm³ to 4.9 J/cm³, respectively. Possible mechanisms for the increase in breakdown voltage with decreasing temperatures are discussed.

Department(s)

Materials Science and Engineering

Publication Status

Open Access

Comments

Acknowledgements: We would like to express thanks to Dr. Ian Burn for many insightful and fruitful discussions. We also acknowledge contributions of our colleagues Nathan Hutchinson, Mary Halub, and Katia Brown.

Keywords and Phrases

Energy storage; Strontium titanate; Cryogenic temperatures; Capacitors; Dielectric; Voltage breakdown; Leakage current; Thick films

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2026 Springer Nature, All rights reserved

Creative Commons Licensing

Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.

Publication Date

2026-03-31

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