Abstract
Calcium zirconate and magnesium oxide have both been found to have useful dielectric properties at high temperatures. Multilayer ceramic capacitors (MLCCs) were made with these dielectrics and platinum electrodes. The relationship between the lifespan (meantime to failure) and applied voltage was determined using Weibull statistics. CaZrO3 capacitors were tested between 550°C and 600°C while MgO capacitors were tested between 600°C and 650°C. The temperature coefficient Ea and the voltage coefficient n of the Prokopowicz–Vaskas equation were determined under various test conditions. Activation energies for calcium zirconate and magnesium oxide were 3.25 eV and 3.48 eV, respectively. Resistance degradation of CaZrO3 and MgO capacitors, tested at 600°C and 250 V, were compared.
Recommended Citation
A. Devoe et al., "Reliability of CaZrO3 and MgO Capacitors at High Temperatures," International Journal of Applied Ceramic Technology, Wiley, Jan 2025.
The definitive version is available at https://doi.org/10.1111/ijac.15180
Department(s)
Materials Science and Engineering
Publication Status
Full Access
Keywords and Phrases
Calcium Zirconate; Capacitor; HALT; High Temperature; Magnesium Oxide; Reliability; Resistance
International Standard Serial Number (ISSN)
1744-7402; 1546-542X
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2025 Wiley, All rights reserved.
Publication Date
01 Jan 2025
