Removal of Inclusions from Solar Grade Silicon using Electromagnetic Field
Abstract
The characteristics of the top-cut solar grade silicon (SoG-Si) scraps produced from SoG-Si ingots were investigated using optical microscope observation, SEM-EDS analysis and automatic inclusion scanning (ASPEX). Particles of SiC and Si3N4 are the main non-metallic inclusions in the SoG silicon top-cut scrap. the deeper into the scrap from the surface, the less and smaller inclusions are found. a laboratory-scale electromagnetic purification unit was used to melt the silicon scraps and remove inclusions from the melt. the experimental results indicated that the electromagnetic (EM) field efficiently pushed the non-metallic particles and less-conductive metallic impurity elements to the boundary layer.
Recommended Citation
A. Dong et al., "Removal of Inclusions from Solar Grade Silicon using Electromagnetic Field," TMS Annual Meeting, vol. 1, pp. 669 - 676, Wiley, Jan 2011.
The definitive version is available at https://doi.org/10.1002/9781118062111.ch77
Department(s)
Materials Science and Engineering
Keywords and Phrases
Electromagnetic field; Inclusions; Solar cell silicon
International Standard Book Number (ISBN)
978-111802945-9
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Wiley, All rights reserved.
Publication Date
01 Jan 2011
