Stressed-Biased Actuators: Fatigue and Lifetime
Abstract
In order to fully understand the performance envelope of Stress-biased piezoelectric actuators, which offer an alternative to electromechanical motors, experimental work was conducted to assess the effects of operational conditions on device performance and fatigue during device lifetime, including tests at five loads, two actuator widths, and two substrate thicknesses and related to the displacement, dielectric, resonance, and impedance properties. Applied load increased the displacement, contributed to substantially decreased lifetime and determined the fatigue mechanism. Highly loaded samples experienced domain pinning, while lightly loaded samples suffered from micro-cracking. Lateral and longitudinal stresses had a similar effect.
Recommended Citation
W. D. Nothwang et al., "Stressed-Biased Actuators: Fatigue and Lifetime," Integrated Ferroelectrics, vol. 71, pp. 249 - 255, Taylor and Francis Group; Taylor and Francis, Dec 2005.
The definitive version is available at https://doi.org/10.1080/10584580590965546
Department(s)
Materials Science and Engineering
Keywords and Phrases
Actuators; Domain pinning; Fatigue; Micro-cracking; Stress-biased; Thunder
International Standard Serial Number (ISSN)
1607-8489; 1058-4587
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Taylor and Francis Group; Taylor and Francis, All rights reserved.
Publication Date
01 Dec 2005
