Electrical Conductivity of Nanocrystalline Sm-Doped CeO2 Thin Film
Abstract
Dense, nanocrystalline films of 20mol%Sm-doped CeO2 (SDC20) on sapphire substrates and bulk samples were prepared using a polymeric precursor. the electrical conductivity was studied as a function of temperature and correlated with the grain size (dg). the brick layer model predicted that the total conductivity should decrease with decreasing grain when the grain boundary resistivity is higher than that of grain. the experimental data followed this model except when dg < 15 nm where it was observed that the total conductivity increased as the grain size decreased, which suggested a reduction of the grain boundary resistivity. This is postulated to result from a decrease in impurity concentration due to increases in the volume of the grain boundary region.
Recommended Citation
T. Suzuki et al., "Electrical Conductivity of Nanocrystalline Sm-Doped CeO2 Thin Film," Ceramic Engineering and Science Proceedings, vol. 24, no. 3, pp. 323 - 328, American Ceramic Society, Jan 2003.
The definitive version is available at https://doi.org/10.1002/9780470294802.ch49
Department(s)
Materials Science and Engineering
International Standard Book Number (ISBN)
978-111904043-9
International Standard Serial Number (ISSN)
0196-6219
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 American Ceramic Society, All rights reserved.
Publication Date
01 Jan 2003
