Abstract
Results of studies of the preparation, structure and physical properties of nanocrystalline CeO2, ZrO2:16%Y (YSZ) and SrCeO 3:5%Yb oxide thin films are presented. A polymeric precursor spin coating technique has been used to obtain dense specimens with stable and uniform microstructure controlled in the grain size range of 1-400 nm. A variety of characterization techniques including X-ray diffraction, impedance spectroscopy, Raman scattering and optical absorption have been used for the evaluation of the microstructure-property relationships. Nanocrystalline specimens are characterized by enhanced electrical conductivity and different stoichiometry compared with microcrystalline materials. A direct comparison has been achieved between the conductivity and quantum confinement effects observed in optical measurements and correlated with a defect model.
Recommended Citation
I. Kosacki and H. U. Anderson, "Microstructure - Property Relationships in Nanocrystalline Oxide Thin Films," Ionics, vol. 6, no. 3 thru 4, pp. 294 - 311, Springer, Jan 2000.
The definitive version is available at https://doi.org/10.1007/BF02374080
Department(s)
Materials Science and Engineering
International Standard Serial Number (ISSN)
1862-0760; 0947-7047
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Springer, All rights reserved.
Publication Date
01 Jan 2000
