Electrical Conductivity of Nanocrystalline Ceria and Zirconia Thin Films

Author

Igor Kosacki
Toshio Suzuki
Vladimir Petrovsky
Harlan U. Anderson, Missouri University of Science and TechnologyFollow

Abstract

The results of studies of the preparation, structure and electrical conductivity of ZrO₂:16% Y and CeO₂ thin films are presented. Dense films with grain size controlled in the region of 1-400 nm have been obtained on monocrystalline sapphire and polycrystalline Al₂O₃ substrates using a polymeric precursor spin coating method. The electrical conductivity of nanocrystalline thin films has been studied as a function of oxygen activity and temperature and correlated with the microstructure. Nanocrystalline specimens are characterized by enhanced electrical conductivity and different stoichiometry compared with microcrystalline material.

Recommended Citation

I. Kosacki et al., "Electrical Conductivity of Nanocrystalline Ceria and Zirconia Thin Films," Solid State Ionics, vol. 136 thru 137, pp. 1225 - 1233, Elsevier, Nov 2000.

The definitive version is available at https://doi.org/10.1016/S0167-2738(00)00591-9

Department(s)

Materials Science and Engineering

International Standard Serial Number (ISSN)

0167-2738

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Elsevier, All rights reserved.

Publication Date

02 Nov 2000