An Exafs Study of Nanocrystalline Thin Films

Author

G. E. Rush
A. V. Chadwick
I. Kosacki
Harlan U. Anderson, Missouri University of Science and TechnologyFollow

Abstract

This work will show the results of Extended X-ray Absorption Fine Structure (EXAFS) spectroscopy on thin films of ZrO2: 16% Y and CeO2, (with a particle size ranging from 4 nm to 330 nm), prepared on a sapphire substrate. The EXAFS measurements will reflect the true nature of the ZrO2 and CeO2 nanocrystallites and will enable meaningful conclusions to be drawn about the levels of disorder at the atomic level.

Recommended Citation

G. E. Rush et al., "An Exafs Study of Nanocrystalline Thin Films," Radiation Effects and Defects in Solids, vol. 156, no. 1, pp. 117 - 121, Taylor and Francis Group; Taylor and Francis, Jan 2001.

The definitive version is available at https://doi.org/10.1080/10420150108216881

Department(s)

Materials Science and Engineering

Keywords and Phrases

Ceria; EXAFS; Nanocrystals; Zirconia

International Standard Serial Number (ISSN)

1042-0150

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Taylor and Francis Group; Taylor and Francis, All rights reserved.

Publication Date

01 Jan 2001