Abstract
The results of the electrical conductivity and Raman scattering measurements of CeO2 thin films obtained by a polymeric precursor spin-coating technique are presented. The electrical conductivity has been studied as a function of temperature and oxygen activity and correlated with the grain size. When compared with microcrystalline samples, nanocrystalline materials show enhanced electronic conductivity. The transition from extrinsic to intrinsic type of conductivity has been observed as the grain size decreases to < 100 nm, which appears to be related to a decrease in the enthalpy of oxygen vacancy formation in CeO2. Raman spectroscopy has been used to analyze the crystalline quality as a function of grain size. A direct comparison has been made between the defect concentration calculated from coherence length and nonstoichiometry determined from electrical measurements.
Recommended Citation
T. Suzuki et al., "Electrical Conductivity and Lattice Defects in Nanocrystalline Cerium Oxide Thin Films," Journal of the American Ceramic Society, vol. 84, no. 9, pp. 2007 - 2014, Wiley, Jan 2001.
The definitive version is available at https://doi.org/10.1111/j.1151-2916.2001.tb00950.x
Department(s)
Materials Science and Engineering
Publication Status
Full Access
International Standard Serial Number (ISSN)
0002-7820
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Wiley, All rights reserved.
Publication Date
01 Jan 2001
