Mechanical vs. Electrical Failure Mechanisms in High Voltage, High Energy Density Multilayer Ceramic Capacitors

Author

Amanda L. Young
Greg Hilmas, Missouri University of Science and TechnologyFollow
Shi C. Zhang, Missouri University of Science and TechnologyFollow
Robert W. Schwartz, Missouri University of Science and TechnologyFollow

Abstract

Causes of breakdown, both mechanical and electrical, in high voltage, high energy density, BaTiO₃ capacitors were studied. The flexural strength of the capacitors was 96 MPa. Failure was due to surface defects or pores close to the surfaces of the samples. The dielectric breakdown strength of the samples was 181 kV/cm. The causes of breakdown were either electrode end effects or pores between the dielectric and electrode layers. Weibull statistics were used to determine if there was a correlation between mechanical failure and dielectric breakdown. A strong correlation between the two types of failure was not found in the study, in contrast to earlier studies of single dielectric layer capacitor materials.

Recommended Citation

A. L. Young et al., "Mechanical vs. Electrical Failure Mechanisms in High Voltage, High Energy Density Multilayer Ceramic Capacitors," Journal of Materials Science, vol. 42, no. 14, pp. 5613 - 5619, Springer Verlag, Jul 2007.

The definitive version is available at https://doi.org/10.1007/s10853-006-1116-2

Department(s)

Materials Science and Engineering

Keywords and Phrases

Weibull Statistics; Breakdown; Dielectric Breakdown Strength; Flexural Strength

International Standard Serial Number (ISSN)

0022-2461

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2007 Springer Verlag, All rights reserved.

Publication Date

01 Jul 2007