Abstract

Lattice parameters, thermal expansion coefficients and Grüneisen parameters of silicon are determined by an X-Ray diffraction method in the temperature range of 180-40 K without the use of liquid gases. Thermal expansion of silicon becomes negative below 120 K which is discussed in terms of its lattice vibrations and crystal structure. © 1972.

Department(s)

Materials Science and Engineering

International Standard Serial Number (ISSN)

0038-1098

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2023 Elsevier, All rights reserved.

Publication Date

01 Jan 1972

Included in

Metallurgy Commons

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