Electrical Properties of YSZ Films Prepared by Net Shape Technology
Abstract
The preparation of dense electrolyte films for most electrochemical devices is a crucial technological process. Net shape technology is a new approach, which uses a combination of colloidal suspensions and polymer precursor techniques, to obtain the dense electrolyte layers. It allows the overlapping of the thickness range from 1 to 10 µm in which other preparation techniques experience difficulties. Net shape processing is a low-temperature technology (preparation temperature can be as low as 400°C) and it eliminates shrinkage of the film during the densification stage, so chemical reactions between the substrate and the film can be minimized. In this study two types of dense substrates were used to confirm these features of the net shape technology: single-crystal sapphire and platinum foil. It was shown that dense yttria-stabilized zirconia (YSZ) layers can be obtained on both types of substrates at temperatures as low as 400°C. Moreover, further higher annealing temperature does not produce either shrinkage or cracking of the film. Electrical properties of YSZ films were measured in plane (on sapphire) and through the film (on platinum) using impedance spectroscopy and two-probe dc methods.
Recommended Citation
P. Z. Jasinski et al., "Electrical Properties of YSZ Films Prepared by Net Shape Technology," Journal of The Electrochemical Society, The Electrochemical Society (ECS), Feb 2005.
The definitive version is available at https://doi.org/10.1149/1.1846711
Department(s)
Materials Science and Engineering
Sponsor(s)
United States. Department of Energy
Keywords and Phrases
Yttria-Stabilized Zirconia; Chemical and Physical Deposition; Electrolytes; Solid Oxide Fuel Cells; Thin Films
International Standard Serial Number (ISSN)
0013-4651
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2005 the Electrochemical Society (ECS), All rights reserved.
Publication Date
01 Feb 2005