Iron - Phosphate Glass (IPG) Waste Forms Produced Using Induction Melter with Cold Crucible
Abstract
A simulated sodium bearing waste (SBW), which represented a type of high sodium and sulfate waste, was successfully vitrified in iron phosphate glasses (IPG), at a maximum waste loading of 40 wt%, using a cold crucible induction melter (CCIM). Scanning electron microscopy (SEM) and X-ray diffraction (XRD) showed that all of the IPG waste forms did not contain sulfate salt segregation or crystalline phases. The calculated composition and the average analytical composition obtained by Electron Probe Microanalysis (EPMA) were in good agreement. The major elements were uniformly distributed throughout the samples. The chemical durability of the IPG waste forms containing 40wt% SBW was evaluated by the product consistency test (PCT) and met current DOE requirements. IPG waste forms were melted at a relatively low temperature and for short times compared to borosilicate glasses. These advantages, combined with those of a significantly higher waste loading and the feasibility for CCIM melting, offer a considerable savings in time, energy, and cost for vitrifying this high sodium and sulfate waste.
Recommended Citation
A. S. Aloy et al., "Iron - Phosphate Glass (IPG) Waste Forms Produced Using Induction Melter with Cold Crucible," Materials Research Society Symposium Proceedings, vol. 807, pp. 187 - 192, Materials Research Society (MRS), Jan 2004.
The definitive version is available at https://doi.org/10.1557/PROC-807-187
Meeting Name
Scientific Basis for Nuclear Waste Management XXVII (2003: Jun. 15-19, Kalmar, Sweden)
Department(s)
Materials Science and Engineering
Second Department
Nuclear Engineering and Radiation Science
Keywords and Phrases
Cold crucible induction melter (IPG); Electron probe microanalysis (EPMA); Product consistency test (PCT); Sodium bearing waste (SBW); Borosilicate glass; Carbonates; Composition; Crystallization; Durability; Electric conductivity; Electrodes; Melting; Mossbauer spectroscopy; Scanning electron microscopy; Silicates; Silicon carbide; X ray diffraction analysis
International Standard Serial Number (ISSN)
0272-9172
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2004 Materials Research Society (MRS), All rights reserved.
Publication Date
01 Jan 2004