Size-Induced Lattice Relaxation in CeO₂ Nanoparticles

Author

X.-D. Zhou, Missouri University of Science and Technology
Wayne Huebner, Missouri University of Science and TechnologyFollow

Abstract

Size-induced lattice relaxation was observed for nanoscale CeO₂ single crystals with an average size from 4 to 60 nm. Results showed the finest crystallites exhibited no strain-induced line broadening, while high temperature annealing resulted in larger grain sizes and significant strains. The observed shift in the x-ray diffraction lattice parameters was assumed to be due to the formation of defects on the lattice, specifically oxygen vacancies. Modeling revealed that the oxygen vacancy concentration ([V^••_O]) was found to be ≈4 x 10²⁰/cm³ for the 4 nm crystallites, and decreased two orders of magnitude for larger 60 nm single crystals.

Recommended Citation

X. Zhou and W. Huebner, "Size-Induced Lattice Relaxation in CeO₂ Nanoparticles," Applied Physics Letters, vol. 79, no. 21, pp. 3512 - 3514, American Institute of Physics (AIP), Nov 2001.

The definitive version is available at https://doi.org/10.1063/1.1419235

Department(s)

Materials Science and Engineering

International Standard Serial Number (ISSN)

0003-6951

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2001 American Institute of Physics (AIP), All rights reserved.

Publication Date

01 Nov 2001